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Published
Mar 31, 2016
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Nguyễn Đăng Toản*; Nguyễn Đức Huy*; Nguyễn Xuân Tùng; Lê Việt Anh. “Dynamic Simulation of Long-Term Voltage Collapse and Analysis of Influencing Factors”. The University of Danang - Journal of Science and Technology, vol. 3, no. 100, Mar. 2016, https://jst-ud.vn/jst-ud/article/view/3684.

Abstract: 40
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PDF: 22
